4

A Structural Integrity Assessment Methodology for Pressurized Vessels

Year:
2006
Language:
english
File:
PDF, 247 KB
english, 2006
7

Atom-probe and field ion microscopy of semiconductors

Year:
1979
Language:
english
File:
PDF, 179 KB
english, 1979
27

GUIDELINES FOR REPORTING COMPUTATIONAL RESULTS IN IIE TRANSACTIONS

Year:
1993
Language:
english
File:
PDF, 398 KB
english, 1993